This HTML5 document contains 107 embedded RDF statements represented using HTML+Microdata notation.

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Namespace Prefixes

PrefixIRI
dbpedia-dehttp://de.dbpedia.org/resource/
dctermshttp://purl.org/dc/terms/
dbohttp://dbpedia.org/ontology/
n24http://dbpedia.org/resource/File:
foafhttp://xmlns.com/foaf/0.1/
n21https://global.dbpedia.org/id/
n22https://web.archive.org/web/20110713002000/http:/www.icselect.com/pdfs/
n19https://web.archive.org/web/20110903182252/http:/www.all-about-test.eu/
yagohttp://dbpedia.org/class/yago/
dbthttp://dbpedia.org/resource/Template:
rdfshttp://www.w3.org/2000/01/rdf-schema#
freebasehttp://rdf.freebase.com/ns/
n20http://www.radio-electronics.com/info/t_and_m/ate/
n12http://commons.wikimedia.org/wiki/Special:FilePath/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
owlhttp://www.w3.org/2002/07/owl#
n25https://web.archive.org/web/20070927195033/http:/wps2a.semi.org/wps/portal/_pagr/115/_pa.115/
dbpedia-ithttp://it.dbpedia.org/resource/
dbpedia-zhhttp://zh.dbpedia.org/resource/
wikipedia-enhttp://en.wikipedia.org/wiki/
dbchttp://dbpedia.org/resource/Category:
dbphttp://dbpedia.org/property/
provhttp://www.w3.org/ns/prov#
xsdhhttp://www.w3.org/2001/XMLSchema#
wikidatahttp://www.wikidata.org/entity/
dbrhttp://dbpedia.org/resource/
n17http://www.maxim-ic.com/appnotes.cfm/an_pk/4303/CMP/

Statements

Subject Item
dbr:Automatic_test_equipment
rdf:type
owl:Thing yago:Content105809192 yago:Component105868954 yago:Abstraction100002137 yago:Cognition100023271 yago:Idea105833840 yago:PsychologicalFeature100023100 yago:Concept105835747 yago:Part105867413 yago:WikicatElectricalComponents
rdfs:label
自动测试设备 Automatic test equipment Automatic Test Equipment Sistema di collaudo automatico
rdfs:comment
I sistemi di collaudo automatico, comunemente definiti con l'acronimo inglese ATE (Automatic Test Equipment), sono tutti quei dispositivi o sistemi, usati per collaudare schede a circuito stampato, circuiti integrati, o qualsiasi altro componente o modulo elettronico correlato. In molti casi è costituito da una vera e propria stazione di lavoro automatica, installata alla fine della linea di produzione, preposta al collaudo del prodotto finito, ad esempio un televisore o un computer. 自動測試設備(Automatic test equipment)簡稱ATE,是指可以利用自動化技術,針對產品進行快速測試的設備,被測試的產品會稱為被测器件(DUT)。簡單的自動測試設備可能只包括電腦控制的萬用表,也可能是包括許多複雜測試設備(實體或是仿真的电子测试设备),其目的是針對複雜的電子產品進行自動化測器以及故障診斷。自動測試設備也可以測試複雜的電子半導體封裝,或進行,待測器件可以是单片系统及集成电路。 Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. Automatic Test Equipment (ATE) ist ein allgemeiner Begriff für messtechnische Apparaturen, die von der Chip- und Elektronik-Industrie während der Produktion zum Testen benutzt werden.Getestet werden beispielsweise * Integrierte Schaltungen im Wafer- oder Chip- und Modul-Test * Analoge Bauteile im eingelöteten Zustand * Leiterplatten ATEs führen folgende Tests durch:
foaf:depiction
n12:Keithley-model4200-CVU.jpg
dcterms:subject
dbc:Automatic_test_equipment dbc:Hardware_testing dbc:Nondestructive_testing dbc:Electronic_test_equipment
dbo:wikiPageID
1430450
dbo:wikiPageRevisionID
1116365202
dbo:wikiPageWikiLink
dbc:Automatic_test_equipment dbr:Java_(programming_language) dbr:Jack_(connector) dbr:Printed_circuit_board dbr:Probe_card dbr:Boundary_scan dbr:LAN_eXtensions_for_Instrumentation dbr:RS-232 dbr:Institute_of_Electrical_and_Electronics_Engineers dbr:Analog_signature_analysis dbr:LabVIEW dbr:Relay dbr:Test_execution_engine dbr:National_Instruments dbr:Inductor dbr:USB dbr:Automation dbr:Plug_&_Play dbr:C++ dbr:Packaged_part dbr:Computer dbr:Rack_unit dbr:Mass_interconnect dbr:Smalltalk dbr:Industrial_PC dbr:Test_automation dbr:19-inch_rack dbr:Avionics dbr:Electronic_test_equipment dbc:Hardware_testing dbr:GPIB dbr:Flying_probe dbr:Python_(programming_language) dbr:Standard_Test_Data_Format dbr:Capacitor dbr:Application_programming_interface dbr:PXI dbr:Automatic_test_pattern_generation dbr:Multimeter dbr:Wafer_prober dbr:Abbreviated_Test_Language_for_All_Systems dbr:Automatic_test_switching dbr:Integrated_circuit dbr:System_on_chip dbc:Nondestructive_testing dbr:Device_under_test dbr:Resistor dbr:Semiconductor_device dbc:Electronic_test_equipment dbr:Wafer_testing dbr:Silicon_wafer dbr:Ammeter dbr:M-Module dbr:IEEE-488 dbr:VMEbus dbr:VXI n24:Keithley-model4200-CVU.jpg dbr:C_(programming_language)
dbo:wikiPageExternalLink
n17:ELK9 n19:technical-literature.html n20:automatic-test-equipment-basics.php n22:ab48_11.pdf n25:274%3FdFormat=application%2Fmsword&docName=P038947
owl:sameAs
freebase:m.050y3f dbpedia-it:Sistema_di_collaudo_automatico wikidata:Q363815 n21:3MRZa dbpedia-de:Automatic_Test_Equipment dbpedia-zh:自动测试设备
dbp:wikiPageUsesTemplate
dbt:Authority_control dbt:Short_description dbt:Div_col dbt:Div_col_end dbt:Reflist
dbo:thumbnail
n12:Keithley-model4200-CVU.jpg?width=300
dbo:abstract
自動測試設備(Automatic test equipment)簡稱ATE,是指可以利用自動化技術,針對產品進行快速測試的設備,被測試的產品會稱為被测器件(DUT)。簡單的自動測試設備可能只包括電腦控制的萬用表,也可能是包括許多複雜測試設備(實體或是仿真的电子测试设备),其目的是針對複雜的電子產品進行自動化測器以及故障診斷。自動測試設備也可以測試複雜的電子半導體封裝,或進行,待測器件可以是单片系统及集成电路。 Automatic Test Equipment (ATE) ist ein allgemeiner Begriff für messtechnische Apparaturen, die von der Chip- und Elektronik-Industrie während der Produktion zum Testen benutzt werden.Getestet werden beispielsweise * Integrierte Schaltungen im Wafer- oder Chip- und Modul-Test * Analoge Bauteile im eingelöteten Zustand * Leiterplatten ATEs führen folgende Tests durch: * Marginales Testen, beispielsweise ob der Baustein beim Anlegen von elektrischen Signalen in irgendeiner Weise reagiert, Kontakttest * Parametertest: Messen von Parametern wie Widerstand, Kapazität, Durchlassspannung, Leckstrom, minimale Versorgungsspannung, Geschwindigkeit versus Versorgungsspannung, maximal erreichbare Geschwindigkeit * Funktionstest: Messen der kompletten Funktion des Bausteins (logische Operationen, Schreiben und Lesen von Speicherchips) Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. I sistemi di collaudo automatico, comunemente definiti con l'acronimo inglese ATE (Automatic Test Equipment), sono tutti quei dispositivi o sistemi, usati per collaudare schede a circuito stampato, circuiti integrati, o qualsiasi altro componente o modulo elettronico correlato. In molti casi è costituito da una vera e propria stazione di lavoro automatica, installata alla fine della linea di produzione, preposta al collaudo del prodotto finito, ad esempio un televisore o un computer. I dispositivi ATE possono essere controllati da PC o PLC tramite appositi software di gestione e i risultati di collaudo archiviati in database per l'analisi del controllo qualità.
prov:wasDerivedFrom
wikipedia-en:Automatic_test_equipment?oldid=1116365202&ns=0
dbo:wikiPageLength
22067
foaf:isPrimaryTopicOf
wikipedia-en:Automatic_test_equipment