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David Erik Aspnes (born 1 May 1939 in Madison, Wisconsin) is an American physicist and a member of the National Academy of Sciences (1998). Aspnes developed fundamental theories of the linear and nonlinear optical properties of materials and thin films, and the technology of spectroscopic ellipsometry (SE). SE is a metrology that is indispensable in the manufacture of integrated circuits.

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  • David E. Aspnes (en)
  • David Aspnes (de)
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  • David Erik Aspnes (born 1 May 1939 in Madison, Wisconsin) is an American physicist and a member of the National Academy of Sciences (1998). Aspnes developed fundamental theories of the linear and nonlinear optical properties of materials and thin films, and the technology of spectroscopic ellipsometry (SE). SE is a metrology that is indispensable in the manufacture of integrated circuits. (en)
  • David Erik Aspnes (* 1. Mai 1939 in Madison, Wisconsin) ist ein US-amerikanischer Physiker. Er studierte an der University of Wisconsin–Madison mit dem Bachelor-Abschluss 1960 und dem Master-Abschluss 1961 und wurde 1965 an der University of Illinois at Urbana-Champaign promoviert. Als Post-Doktorand war er an der University of Illinois und an der Brown University. Ab 1967 war er bei den Bell Laboratories und deren Nachfolger Bellcore, wo er die Abteilung Grenzflächenphysik leitete. 1992 wurde er Professor für Physik an der North Carolina State University. (de)
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  • David E. Aspnes (en)
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  • David E. Aspnes (en)
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  • Madison, WI, United States (en)
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