About: Automatic test pattern generation

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ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG

Attributes	Values
rdf:type	company yago:Artifact100021939 yago:Circuit103033362 yago:Device103183080 yago:ElectricalDevice103269401 yago:Instrumentality103575240 yago:Object100002684 yago:PhysicalEntity100001930 yago:Whole100003553 yago:WikicatElectronicCircuits
rdfs:label	Automatic test pattern generation (en) Generazione di programmi di prova automatici (it) ATPG (sv) ATPG (zh)
rdfs:comment	自動測試圖樣產生（英語：Automatic test pattern generation, ATPG）系統是一種工具，產生資料給製造出來後的数字电路作測試使用。超大型積體電路的测试平台，要達到非常高的錯誤涵蓋率是非常困難的工作，因為它的複雜度很高。針對组合逻辑电路（Combinatorial logic）和时序逻辑电路（Sequential logic）的電路測試，必須要使用不同的 ATPG 方法。 (zh) ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG (en) La generazione automatica di vettori di collaudo (ATPG) è un metodo e una tecnologia, utilizzata per trovare una sequenza di collaudo che, quando applicata ad un circuito digitale, dà la possibilità ai tester di distinguere fra il comportamento del circuito corretto e non corretto determinato da anomalie funzionali. Le procedure generate sono usate per collaudare i dispositivi a semiconduttore dopo la produzione, ed in taluni casi per assistere alla determinazione delle cause di malfunzionamento. L'efficacia dell'ATPG è misurata dall'ammontare dei difetti modellati, o , che sono rivelati ed il numero delle procedure generate. Quest'ammontare indica genericamente la qualità del controllo (più elevata con maggiore rivelazione di guasti) e il tempo di esecuzione dei collaudi (più elevato con (it) Automatic Test Pattern Generation är ett sätt att automatisera testmönstergenereringen i tillverkningen av en integrerad krets. Man använder testmönster för att undersöka om en krets har fått defekter vid framställningen, defekter som orsakar fel funktion eller ingen funktion alls. (sv)
dcterms:subject	Electronic circuit verification
Wikipage page ID	374448 (xsd:integer)
Wikipage revision ID	1118453547 (xsd:integer)
Link from a Wikipage to another Wikipage	Electronic design automation Algorithm VHSIC Combinational logic Boundary scan NP-complete Controllability State space Very-large-scale integration Pseudorandom Fault coverage Fault model Design for test Logic simulation Test vector Failure analysis Digital circuit Prabhu Goel ASIC Boolean difference JTAG Automatic test equipment Electronic circuit verification Boolean satisfiability problem Built-in self-test Scan chain FAN algorithm Observability Stuck-at fault Sequential logic Boolean satisfiability Test quality P = NP problem Fault models Design For Test Partial scan Sequential circuit dbr:Literal_proposition dbr:Suresh_kumar_Devanathan
Link from a Wikipage to an external page	http://www.date-conference.com/ http://www.ieee-ets.org/ http://www.itctestweek.org/ http://www.tttc-vts.org/
sameAs	Automatic test pattern generation Automatic test pattern generation Automatic test pattern generation Automatic test pattern generation Automatic test pattern generation Automatic test pattern generation Automatic test pattern generation
dbp:wikiPageUsesTemplate	dbt:Citation_needed dbt:Cite_book dbt:ISBN dbt:Main dbt:Overline
has abstract	ATPG (acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an electronic design automation method/technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test (full scan, synchronous sequential, or asynchronous sequential), the level of abstraction used to represent the circuit under test (gate, register-transfer, switch), and the required test quality. (en) La generazione automatica di vettori di collaudo (ATPG) è un metodo e una tecnologia, utilizzata per trovare una sequenza di collaudo che, quando applicata ad un circuito digitale, dà la possibilità ai tester di distinguere fra il comportamento del circuito corretto e non corretto determinato da anomalie funzionali. Le procedure generate sono usate per collaudare i dispositivi a semiconduttore dopo la produzione, ed in taluni casi per assistere alla determinazione delle cause di malfunzionamento. L'efficacia dell'ATPG è misurata dall'ammontare dei difetti modellati, o , che sono rivelati ed il numero delle procedure generate. Quest'ammontare indica genericamente la qualità del controllo (più elevata con maggiore rivelazione di guasti) e il tempo di esecuzione dei collaudi (più elevato con maggiori procedure). L'efficienza dell'ATPG è un altro fattore importante. È influenzata dal modello di guasto in esame, dal tipo del circuito in collaudo (con predisposizioni per il collaudo automatico, sequenziale sincrono, o sequenziale asincrono), dal grado di astrazione utilizzato per rappresentare il circuito in esame (porte, registri a transistor, interruttori), e la copertura di qualità di collaudo richiesta. (it) Automatic Test Pattern Generation är ett sätt att automatisera testmönstergenereringen i tillverkningen av en integrerad krets. Man använder testmönster för att undersöka om en krets har fått defekter vid framställningen, defekter som orsakar fel funktion eller ingen funktion alls. Eftersom det för varje grind i kretsen behövs en detektering av ett flertal olika fel som kan uppstå och eftersom grindens utgångar och/eller ingångar ofta inte är direkt observerbara är det ett komplext och oöverskådligt problem att lösa. ATPG verktyg används för att skapa mönster som kontrollerar alla grindar med alla fel (om så är möjligt, det är det inte alltid). (sv) 自動測試圖樣產生（英語：Automatic test pattern generation, ATPG）系統是一種工具，產生資料給製造出來後的数字电路作測試使用。超大型積體電路的测试平台，要達到非常高的錯誤涵蓋率是非常困難的工作，因為它的複雜度很高。針對组合逻辑电路（Combinatorial logic）和时序逻辑电路（Sequential logic）的電路測試，必須要使用不同的 ATPG 方法。 (zh)
gold:hypernym	Technology
prov:wasDerivedFrom	wikipedia-en:Automatic_test_pattern_generation?oldid=1118453547&ns=0
page length (characters) of wiki page	12979 (xsd:nonNegativeInteger)
foaf:isPrimaryTopicOf	wikipedia-en:Automatic_test_pattern_generation
is Link from a Wikipage to another Wikipage of	Electronic design automation Design for testing Integrated circuit design Test vector generator Transputer Clique problem Clique (graph theory) Fault coverage Fault grading Fault model Many-valued logic Test vector Digital electronics Failure analysis Prabhu Goel SystemVerilog

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